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• CMOS/BiCMOS/SiGe BiCMOS RFIC Technologies
• Characterization and Modeling Techniques of RF Devices
• Characterization and Verification of RF Circuits

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1. S.C. Wang, P. Su, K.M. Chen, C.T. Lin, V. Liang, G.W. Huang, ¡§Temperature Dependence of High Frequency Noise Behaviors for RF MOSFETs¡¨, IEEE Microwave and Wireless Components Letters, vol.18, no.8, pp. 530-532, August, 2008.
2. H.H. Hu, K.M. Chen, G.W. Huang, M.Y. Chen, E. Cheng, Y.C. Yang, and C.Y. Chang, ¡§Temperature-Dependent Capacitance Characteristics of RF LDMOS Transistors With Different Layout Structures,¡¨ IEEE Electron Device Letters, vol. 29, no. 7, pp. 784-787, July, 2008.
3. H.H. Hu, K.M. Chen, G.W. Huang, A. Chien, E. Cheng, Y.C. Yang, and C.Y. Chang, ¡§Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors¡¨, Jpn. J. Appl. Phys., vol. 47, No. 4, pp. 2650-2655, April, 2008.
4. S.C. Wang, P. Su, K.M. Chen, C.T. Lin, V. Liang, and G.W. Huang, ¡§Radio-Frequency Silicon-on-Insulator Modeling Considering the Neutral-Body Effect¡¨, Jpn. J. Appl. Phys., vol. 47, No. 4, pp. 2087-2091, April, 2008.
5. S.Y. Huang, K.M. Chen, G.W. Huang, C.C. Hung, W.S. Liao, and C.Y. Chang, ¡§Electrical Stress Effect on RF Power Characteristics of SiGe Heterojunction Bipolar Transistors¡¨, IEEE Microelectronics Reliability, vol.48, no.2, pp. 193-199, February, 2008.
6. W.L. Chen, S.F. Chang, G.W. Huang, Y.S. Jean and T.H. Yeh, ¡§A Ku-band Interference-Rejection CMOS Low-Noise Amplifier Using Current-Reused Stacked Common-Gate Topology¡¨, IEEE Microwave and Wireless Components Letters, vol. 17, no. 10, pp. 718-720, October, 2007.
7. S.C. Tseng, C.C. Meng, and G.W. Huang, ¡§SiGe BiCMOS Subharmonic Gilbert Mixer Using Lumped-Element Rat-Race Couplers¡¨, Microwave and Optical Technology Letters, vol.49, No.8, pp.2018-2020, August, 2007.
8. S.C. Wang, P. Su, K.M. Chen, C.T. Lin, V. Liang, and G.W. Huang, ¡§On the RF Extrinsic Resistance Extraction for Partially-Depleted SOI MOSFETs¡¨, IEEE Microwave and Wireless Components Letters, vol. 17, no. 5, pp. 364-366, May, 2007.
9. H.H. Hu, K.M. Chen, G.W. Huang, C.Y. Chang, Y.C. Lu, Y.C. Yang, and E. Cheng, ¡§Characterization of RF Lateral-Diffused Metal-Oxide-Semiconductor Field-Effect Transistors with Different Layout Structures,¡¨ Jpn. J. Appl. Phys., vol. 46, No. 4B, pp. 2032-2036, April, 2007.
10. W.L. Chen, G.W. Huang, and S.F. Chang, ¡§Broadband CMOS Mixer Cell for UWB Applications¡¨, Microwave and Optical Technology Letters, vol.49, No.1, pp.127-128, January, 2007.
11. H.Y. Chen, K.M. Chen, G.W. Huang, and C.Y. Chang, ¡§Small-Signal Modeling of SiGe HBTs Using Direct Parameter-Extraction Method,¡¨ IEEE Transactions on Electron Devices, vol.53, no. 9, pp. 2287-2295, September, 2006.
12. H.Y. Chen, K.M. Chen, G.W. Huang, and C.Y. Chang, ¡§An Improved Parameter Extraction Method of SiGe HBTs¡¦ Substrate Network,¡¨ IEEE Microwave and Wireless Components Letters, vol. 16, no. 6, pp. 321-323, June, 2006.
13. M.H. Cho, G.W. Huang, Y.H. Wang, L.K. Wu, ¡§A Scalable Noise De-Embedding Technique for On-Wafer Microwave Device Characterization¡¨, IEEE Microwave and Wireless Components Letters, vol.15, no.10, pp.649-651, October, 2005.
14. M.H. Cho, G.W. Huang, L.K. Wu, C.S. Chiu, Y.H. Wang, K.M. Chen, H.C. Tseng, and T.L. Hsu, ¡§A Shield-Based Three-Port De-Embedding Method for Microwave On-Wafer Characterization of Deep-Submicrometer Silicon MOSFETs¡¨, IEEE Trans. Microwave Theory and Techniques, vol.53, no.9, pp.2926-2934, September, 2005.
15. H.Y. Chen, G.W. Huang, K.M. Chen, and C.Y. Chang, ¡§Noise Parameters Computation of Microwave Devices Using Genetic Algorithms, ¡¨ IEICE Transactions on Electronics, vol.E88-C, no.7, pp.1382-1384, July, 2005.
16. K.M. Chen, A.S. Peng, G.W. Huang, H.Y. Chen, S.Y. Huang, C.Y. Chang, H.C. Tseng, T.L. Hsu, and V. Liang, ¡§Linearity and Power Characteristics of SiGe HBTs at High Temperatures for RF Applications,¡¨ IEEE Transactions on Electron Devices, vol. 52, pp. 1452-1458, July, 2005.
17. S.Y. Huang, K.M. Chen, G.W. Huang, V. Liang, H.C. Tseng, T.L. Hsu, and C.Y. Chang, ¡§Hot-Carrier Induced Degradations on RF Power Characteristics of SiGe Heterojunction Bipolar Transistors,¡¨ IEEE Transactions on Device and Materials Reliability, vol.5, no.2, pp.183-189, June, 2005.
18. H.Y. Chen, K.M. Chen, G.W. Huang, and C.Y. Chang, ¡§A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit,¡¨ IEICE Transaction on Electronics, vol.E88-C, no.6, pp.1133-1141, June, 2005.
19. K.M. Chen, H.H. Hu, G.W. Huang, and C.Y. Chang, ¡§Degradation of Low-Frequency Noise in Partially Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field-Effect Transistors by Hot-Carrier Stress,¡¨ Jpn. J. Appl. Phys., vol. 44, no. 6A, pp. 3832-3835, June, 2005.
20. Wu, G.W. Huang, K.M. Chen, C.Y. Chang, H.C. Tseng, and T.L. Hsu, ¡§Extraction of Substrate Parameters for RF MOSFET¡¦s Based on Four-Port Measurement,¡¨ IEEE Microwave and Wireless Components Letters, vol.15, no.6, pp.437-439, June, 2005.
21. 21. S.D. Wu, G.W. Huang, K.M. Chen, H.C. Tseng, T.L. Hsu, and C.Y. Chang, ¡§RF MOSFET Characterization by Four-Port Measurement,¡¨ IEICE Transaction on Electronics, vol.E88-C, no.5, pp.851-856, May, 2005.
22. M.H. Cho, G.W. Huang, C.S. Chiu, K.M. Chen, A.S. Peng, and Y.M. Tseng, ¡§A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement,¡¨ IEICE Transaction on Electronics, vol.E88-C, no.5, pp.845-850, May, 2005.
23. M.H. Cho, K.M. Chen, G.W. Huang, and C.S. Chiu, ¡§Design and Analysis of On-Chip Tapered Transformers for Silicon Radio-Frequency Integrated Circuits,¡¨ Jpn. J. Appl. Phys., vol. 44, no. 4B, pp. 2166-2170, April, 2005.
24. H.Y. Chen, K.M. Chen, G.W. Huang, C.Y. Chang, and T.Y. Huang, ¡§An Improved Approach for Small-Signal Equivalent-Circuit Parameter Determination of InGaP/GaAs HBT,¡¨ Microwave and Optical Technology Letters, vol.44, no.5, pp. 456-460, March, 2005.
25. S.Y. Huang, K.M. Chen, G.W. Huang, H.C. Tseng, T.L. Hsu, C.Y. Chang, and T.Y. Huang, ¡§Hot-Carrier Effects on Power Characteristics of SiGe HBTs¡¨, IEEE Electron Device Letters, vol. 25, no.6, pp. 393-395, June, 2004.
26. S.Y. Wen, G.W. Huang, and K.M. Chen, ¡§An accurate and low-cost method for on-wafer LNA noise figure measurement,¡¨ IEICE Transaction on Electronics, vol. E87-C, no. 5, pp. 742-748, May, 2004.
27. H.Y. Chen, K.M. Chen, G.W. Huang, C.Y. Chang, and T.Y. Huang, ¡§A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement,¡¨ IEICE Transaction on Electronics, vol. E87-C, no. 5, pp. 726-732, May, 2004.
28. K.M. Chen, G.W. Huang, L.H. Chang, H.C. Tseng, and T.L. Hsu, ¡§High-frequency characteristics of SiGe heterojunction bipolar transistors under pulsed-mode operation,¡¨ IEICE Transaction on Electronics, vol. E87-C, no. 5, pp. 720-725, May, 2004.
29. 29. K.M. Chen, H.H. Hu, G.W. Huang, W.K. Yeh, and C.Y. Chang, ¡§Low-frequency noise in partially-depleted SOI MOSFETs operating from linear region to saturation region at various temperatures,¡¨ Jpn. J. Appl. Phy., Part 1, vol. 43, no. 4B, pp. 2188-2189, April, 2004.
30. K.M. Chen, G.W. Huang, S.C. Wang, W.K. Yeh, Y.K. Fang, and F.L. Yang, ¡§Characterization and Modeling of SOI Varactors at Various Temperatures,¡¨ IEEE Transactions on Electron Devices, vol. 51, no. 3, pp. 427-433, March, 2004.
31. K.M. Chen, G.W. Huang, D.Y. Chiu, H.J. Huang, and C.Y. Chang, ¡§Analysis of Low-frequency Noise in Boron-doped Polycrystalline Silicon-Germanium Resistors¡¨, Appl. Phys. Lett., vol.81, no.14, pp.2578-2580, September, 2002.
32. C.Y. Su, L.P. Chen, S.J. Chang, , B.M. Tseng, D.C. Lin, G.W. Huang, Y.P. Ho, H.Y. Lee, J.F. Kuan, W.Y. Wen, P. Liou, C.L. Chen, L.Y. Leu, K.A. Wen, and C.Y. Chang, ¡§A Macro Model of Silicon Spiral Inductor¡¨, Solid-State Electronic. vol.46, no.5, p. 759-767, May, 2002.
33. H. T. Lue, T. Y. Tseng, and G. W. Huang, ¡§A Novel Method to Characterize the Dielectric and Interfacial Properties of Metal-Insulator-Semiconductor Structures by Microwave Measurement¡¨, J. Appl. Phy. vol.91, no.8, pp.5275-5282, April, 2002.
34. C.Y. Su, L.P. Chen, S.J. Chang, G.W. Huang, D.C. Lin, Y.P. Ho, B.M. Tseng, H.Y. Lee, J.F. Kuan, Y.M. Deng, K.A. Wen, and C.Y. Chang, ¡§A Automatic Macro Program for Radio Frequency MOSFETs Characteristics Analysis¡¨, Microwave Journal, vol.44, no.10, p. 99-108, October, 2001.
35. K.M. Chen, H.J. Huang, C.Y. Chang, T.Y. Huang, G.W. Huang, and L.P. Chen, ¡§The Reaction of Co and Si1-xGex for MOSFET with Poly- Si1-xGex Gate,¡¨ Materials Chemistry and Physics, vol.69, p.84-88, March, 2001.
36. K.M. Chen, H.J. Huang, C.Y. Chang, L.P. Chen, and G.W. Huang, ¡§Deposition of polycrystalline Si and SiGe by ultra-high vacuum chemical molecular epitaxy,¡¨ J. Vac. Sci. Technol. A., vol.18, no.4, pp.1196-1201, July/August, 2000.
37. C.Y. Su, L.P. Chen, S.J. Chang, G.W. Huang, Y.P. Ho, B.M. Tseng, D.C. Lin, H.Y. Lee, J.F. Kuan, Y.M. Deng, C.L. Chen, L.Y. Len, K.A. Wen, and C.Y. Chang, ¡§Coplanar Probe Pad Design on the Noise Figures of 0.35ƒÝm MOSFETs¡¨, Electronics Letters, vol. 36, no.15, pp.1280-1281, July, 2000.
38. K. A. Wen, W. S. Wuen, G.W. Huang, L .P. Chen, K. Y. Chen, S.F. Liu, Z. S. Chen, C. Y. Chang, ¡§CMOS RFIC¡GApplication to Wireless Transceiver Design¡¨, IEICE Transaction on Electronic, vol.E83-C, no.2, pp.131-142, February, 2000.
39. K.M. Chen, H.J. Huang, G.W. Huang, C.Y. Chang, and L.P. Chen, ¡§P-Channel Metal Oxide Semiconductor Field Effect Transistors with Polycrystalline-SiGe Gate Grown by Ultra-High Vacuum Chemical Vapor Deposition System,¡¨ Jpn. J. Appl. Phy., Part2, vol.38, no.10A, pp. L1099-L1101, October, 1999.
40. L.P Chen, Y.C. Chan, S.J. Chang, G.W. Huang, and C.Y. Chang, ¡§Direct Oxidation of Si1-xGex Layers using Vacuum-Ultra-Violet Light Radiation in Oxygen¡¨, J. J. Appl. Phys., vol.37, no.2A, pp.L122-L124, February, 1998.
41. G.W. Huang, L.P. Chen, C.T. Chou, K.M. Chen, H.C. Tseng, W.C. Tsai, and C.Y. Chang, ¡§Low temperature epitaxy of Si and Si1-xGex by ultrahigh vacuum chemical molecular epitaxy¡¨, J. Appl. Phys., vol.81, no.1, pp.205-210, January, 1997.
• ·|ij½×¤å
1. G.W. Huang, K.M. Chen, H.Y. Chenn C.H. Huang, and C.Y. Chang, ¡¨Impact of Body Bias on the High Frequency Performance of Partially Depleted SOI MOSFETs¡¨, to be presented in 2008 Asia Pacific Microwave Conference, Hong Kong, China, December, 2008.
2. K.M. Chen, H.Y. Chen, G.W. Huang, W.S. Liao, and C.Y. Chang, ¡§RF Noise Modeling of SiGe HBTs Using Four-Port De-embedding Method¡¨ , to be presented in 2008 Asia Pacific Microwave Conference, Hong Kong, China, December, 2008.
3. C.S. Chiu, W.L. Chen, K.H. Liao, B.Y. Chen, Y.M. Teng, G.W. Huang, and L.K. Wu, ¡§Pad Characterization for CMOS Technology Using Time Domain Reflectometry¡¨, to be presented in 2008 IEEE International RF and Microwave Conference, Kuala Lumpur, Malaysia, December, 2008.
4. W.L. Chen, S.F. Chang, K.M. Chenn, K.H. Liao, G.W. Huang, and J.C. Chang, ¡§A Hybrid OPEN Model Technique for Accurate Device Characterization¡¨, to be presented in 2008 IEEE International RF and Microwave Conference, Kuala Lumpur, Malaysia, December, 2008.
5. S.C. Wang, P. Su, K.M. Chen, S.Y. Huang, C.C. Hung, V. Liang, C.Y. Tseng and G.W. Huang, ¡§RF Small-Signal and Noise Modeling for SOI Dynamic Threshold Voltage MOSFETs¡¨, in 2008 International Conference on Solid State Devices and Materials (SSDM 2008), Tsukuba, Japan, September, 2008.
6. Y.T. Chen, K.M. Chen, W.S. Liao, G.W. Huang, and F.S. Yeh, ¡§Low-frequency Noise Characteristics of SiGe-channel PMOSFETs with High-compressive ILD-SiNx Stressing Layer¡¨, in 2008 International Conference on Solid State Devices and Materials (SSDM 2008), Tsukuba, Japan, September, 2008.
7. C.S. Chiu, G.C. Chang, C.L. Gu, K.M. Peng, Erik S. Jeng, W.L. Chen, G.W. Huang, and L.K. Wu, ¡§Implementation of Surface Acoustic Wave Vapor Sensor Using CMOS Amplifier¡¨, in 2008 International Conference on Solid State Devices and Materials (SSDM 2008), Tsukuba, Japan, September, 2008.
8. S.Y. Huang, C.C. Hung, V. Liang, W.S. Liao, T.L. Li, J.H. Li, C.Y. Tzeng, G.W. Huang, and K.M. Chen, ¡§Novel Pseudo-Drain (PD) RF Power Cell in 0.13 um CMOS Technology¡¨, in 2008 IEEE RFIC Symposium, Atlanta, Georgia, U.S.A., pp. 259-262, June, 2008.
9. H.H. Hu, K.M. Chen, G. W. Huang, C.Y. Chang, Y.C. Lu, Y.C. Yang, and E. Cheng, ¡§Analysis of Temperature Effects on the High-Frequency Characteristics of RF LDMOS Transistors,¡¨ in International Conference on Solid State Devices and Materials (SSDM 2007), Tsukuba, Japan, September, 2007.
10. S.Y. Huang, K.M. Chen, and G. W. Huang, C.Y. Chang, C.C. Hung, V. Liang, and B.Y. Chen, ¡§Design for Integration of RF Power Transistors in 0.13 ƒÝm Advanced CMOS Technology¡¨, in 2007 IEEE MTT-S International Microwave Symposium, Honolulu, Hawaii, U.S.A., pp. 323-326, June, 2007.
11. H.H. Hu, K.M. Chen, G.W. Huang, C.Y. Chang, Y.C. Lu, Y.C. Yang, and E. Cheng, ¡§Characterization of RF LDMOS Transistors with Different Layout Structures,¡¨ in 2006 International Conference on Solid State Devices and Materials (SSDM 2006), Yokohama, Japan, September, 2006.
12. S.D. Wu, G.W. Huang, K.M. Chen, and K.H. Liao, ¡¨Modeling the substrate effect of RF MOSFET¡¦s based on 4-port measurement,¡¨ in 67th ARFTG Conference, San Francisco, CA, U.S.A., June, 2006.
13. S.Y. Huang, K.M. Chen, G.W. Huang, D.Y. Yang, C.Y. Chang, 2006, ¡§Characterization and modeling of RF MOSFETs under hot carrier stress and oxide breakdown,¡¨ in 2006 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Long Beach, CA, U.S.A., January, 2006.
14. H.Y. Chen, K.M. Chen, G.W. Huang, and C.Y. Chang, ¡§An Analysis of Base Current Effect on the Anomalous Dip of Scattering Parameter S12 in SiGe HBTs¡¨, in 2005 Asia-Pacific Microwave Conference, Suzhou, China, pp. 1082-1084, December, 2005.
15. K.M. Chen, D.Y. Yang, S.Y. Huang, G.W. Huang, L.H. Chang, V. Liang, H.C. Tseng, and C.Y. Chang, ¡§Effects of Hot Carrier Stress and Oxide Breakdown on RF Characteristics of MOSFETs¡¨, in 2005 Asia-Pacific Microwave Conference, Suzhou, China, pp. 1039-1042, December, 2005.
16. L.H. Chang , K.M. Chen, G.W. Huang, H.C. Tseng and V. Liang, ¡§Pulsed Characteristics of Microwave SiGe Heterojunction Bipolar Transistors Operated at High Collector Voltages,¡¨ in International Conference on Solid State Devices and Materials (SSDM 2005),, Hyogo, Japan, September, 2005.
17. S.Y. Huang, K.M. Chen, G.W. Huang, D.Y. Yang, C.Y. Chang, V. Liang, and H.C. Tseng, ¡§Impact of Hot Carrier Stress on RF Power Characteristics of MOSFET,¡¨ in 2005 IEEE MTT-S International Microwave Symposium, Long Beach, U.S.A., June 2005.
18. M.H. Cho, G.W. Huang, C.S. Chiu, and K.M. Chen, ¡§Unified Parasitic De-Embedding Methodology of On-Wafer Multi-Port Device Characterization,¡¨ in 2005 IEEE MTT-S International Microwave Symposium, Long Beach, U.S.A., June 2005.
19. C.S. Chiu, G.W. Huang, D.Y. Chiu, K.M. Chen, M.H. Cho, and S.C. Wang, ¡§A Novel Process-Controlled-Monitor Structure Suitable for RF CMOS Characterization,¡¨ in 2005 IEEE MTT-S International Microwave Symposium, Long Beach, U.S.A., June 2005.
20. M. H. Cho, C. S. Chiu, G. W. Huang, Y. M. Teng, L. H. Chang, K. M. Chen, and W. L. Chen, ¡§A Fully-Scalable De-Embedding Method for On-Wafer S-Parameter Characterization of CMOS RF/Microwave Devices,¡¨ in 2005 IEEE RFIC Symposium, Long Beach, U.S.A., June 2005.
21. H.Y. Chen, K.M. Chen, G.W. Huang, M.H. Cho, and C.Y. Chang, ¡§Computation of Noise Parameters Using Genetic Algorithms,¡¨ in 34th European Microwave Conference, Amsterdam, Netherlands, pp. 789¡V792, October, 2004.
22. M.H. Cho, G.W. Huang, K.M. Chen, A.S. Peng, C.S. Chiu, Y.M. Teng, and H.Y. Chen, ¡§A Novel De-embedding Technique for On-Wafer Microwave Characterization,¡¨ in 34th European Microwave Conference, Amsterdam, Netherlands, pp. 917¡V920, October, 2004.
23. K.M. Chen, H.H. Hu, G.W. Huang, and C.Y. Chang, ¡§Degradation of low-frequency noise in PD SOI MOSFETs after hot-carrier stress,¡¨ in 2004 International Conference on Solid State Devices and Materials (SSDM 2004), Tokyo, Japan, September, 2004.
24. M.H. Cho, G.W. Huang, C.S. Chiu, K.M. Chen, and A.S. Peng, ¡§Design and Analysis of On-Chip Tapered Transformers for Silicon RFICs,¡¨ in 2004 International Conference on Solid State Devices and Materials (SSDM 2004), Tokyo, Japan, September, 2004.
25. A.S. Peng, K.M. Chen, G.W. Huang, M.H. Cho, S.C. Wang, Y.M. Deng, H.C. Tseng, and T.L. Hsu, ¡§Temperature Effect on Power Characteristics of SiGe HBTs¡¨, in 2004 IEEE International Microwave Symposium, Fort Worth, U.S.A., p. 1955-1958, June, 2004.
26. M.H. Cho, G.W. Huang, K.M. Chen, and A.S. Peng, ¡§A Novel Cascade-Based De-embedding Method for On-Wafer Microwave Characterization and Automatic Measurement¡¨, in 2004 IEEE International Microwave Symposium, Fort Worth, U.S.A., p. 1237-1240, June, 2004.
27. K.M. Chen and G.W. Huang, ¡§Flicker Noise Characterization of Co-silicide/SiGe Contacts Using TLM Test Structures, ¡¨ in 2004 IEEE International Conference on Microelectronic Test Structures, Awaji, Japan, March, 2004.
28. S.C. Wang, G.W. Huang, K.M. Chen., H.C. Tseng, and T.L. Hsu, ¡§A Practical Method to Extract Extrinsic Parameters for the Silicon MOSFET Small-Signal Model¡¨, in 2004 Workshop on Compact Modeling, Boston, U.S.A., March, 2004.
29. A.S. Peng, K.M. Chen, G.W. Huang, H.Y. Chen, and C.Y. Chang, ¡§Characterization and modeling of silicon tapered inductors¡¨, in 2004 Workshop on Compact Modeling, Boston, U.S.A., March, 2004.
30. S.C. Wang, G.W. Huang, S.D. Wu, K.M. Chen, A.S. Peng, M.H. Cho, H.C. Tseng, and T.L. Hsu, ¡§Temperature Effects on the Performance of 4-Port Transformers¡¨ in 2003 International Semiconductor Device Research Symposium, Washington, D.C., U.S.A., pp.190-191, December, 2003.
31. x`M.H. Cho, G.W. Huang, K.M. Chen, H.C. Tseng, and T.L. Hsu, ¡§Slow-Wave Characteristics of Interconnects on Silicon Substrates¡¨, in 2003 International Semiconductor Device Research Symposium, Washington, D.C., U.S.A., pp.188-189, December, 2003.
32. K.M. Chen, W.K. Yeh, G.W. Huang, Y.K. Fang, and F.L. Yang, ¡§Characterization and Modeling of SOI Varactors at Various Temperatures,¡¨ in The 15th International Conference on Microelectronics, Cairo, Egypt, December, 2003.
33. S.D. Wu, G.W. Huang, S.Y. Wu, L.P. Chen, and C.Y. Chang, ¡§Characterization of 2-port Configuration MOSFET¡¦s Amplifiers by 4-port Measurement,¡¨ in 2003 Asia-Pacific Microwave Conference, Seoul, Korea, pp.1431-1433, November, 2003.
34. K.M. Chen, G.W. Huang, L.H. Chang H.C. Tseng, T.L. Hsu, H.Y. Chen, S.Y. Huang, and C.Y. Chang, ¡§Dynamic Thermal Characteristics of SiGe HBTs with Various Emitter Geometries,¡¨ in 2003 Asia-Pacific Microwave Conference, Seoul, Korea, pp.510-513, November, 2003.
35. K.M. Chen, G.W. Huang, L.H. Chang H.C. Tseng, T.L. Hsu, H.Y. Chen, S.Y. Huang, H.H. Hu and C.Y. Chang, ¡§High-Frequency Characteristics of SiGe Heterojunction Bipolar Transistors Under Pulsed-Mode Operation,¡¨ in 2003 Asia-Pacific Microwave Conference, Seoul, Korea, pp.460-463, November, 2003.
36. G.W. Huang, A.S. Peng, K.M. Chen, and L.H. Chang, ¡§Dynamic Thermal Characterization and Modeling of Silicon Bipolar Junction Transistors using Pulsed RF Measurement System,¡¨ in 2003 International Conference on Solid State Devices and Materials (SSDM 2003), Tokyo, Japan, pp.666-667, September, 2003.
37. K.M. Chen, H.H. Hu, G.W. Huang, S.Y. Huang, A.S. Peng, W.K. Yeh, and C.Y. Chang, 2003, September, ¡§Low-Frequency Noise in Partially-Depleted SOI MOSFETs Operating from Linear Region to Saturation Region at Various Temperatures,¡¨ in 2003 International Conference on Solid State Devices and Materials (SSDM 2003), Tokyo, Japan, pp.634-635, September, 2003.
38. M.H. Cho, G.W. Huang, K.M. Chen, S.Y. Wen, and S.C. Wang, ¡§Improved Modeling Technique for On-Chip Silicon Spiral Inductors,¡¨ in 2003 International Conference on Solid State Devices and Materials (SSDM 2003), Tokyo, Japan, pp.448-449, September, 2003.
39. S.C. Wang, G.W. Huang, S.D. Wu, A.S. Peng, and M.H. Cho, ¡§Monolithic Transformer Modeling Based on the 4-port Characterization Technique,¡¨ in 2003 International Conference on Solid State Devices and Materials (SSDM 2003), Tokyo, Japan, pp.446-447, September, 2003.
40. G.W. Huang, D.Y. Chiu, K.M. Chen, Y.M. Deng and S.C. Wang, ¡§An Automatic Program suitable for On-Wafer Characterization and Statistic Analysis of Microwave Devices¡¨, in 61th ARFTG Conference, Philadelphia, U.S.A., pp.157-161, June, 2003.
41. G.W. Huang, D.Y. Chiu, and K.M. Chen, ¡§An Automatic Macro Program developed for Characterization, Parameter Extraction and Statistic Analysis of Spiral Inductors¡¨, in 2003 Workshop on Compact Modeling, San Francisco, U.S.A., February, 2003.
42. G.W. Huang, K.M. Chen, J.F. Kuan, D.Y. Chiu, S.Y. Wen, Y.M. Teng, S.C. Wang, M.H. Cho, A.S. Peng, L.H. Chang, and J. Liu, ¡§Improved Three-Step Noise Parameter De-embedding Method Applied in Silicon On-Wafer RF Test-Structures¡¨ in 2002 Asia-Pasific Microwave Conference, Kyoto, Japan, p.458-461, November, 2002.
43. K.M. Chen, G.W. Huang, D. Y. Chiu, H.J. Huang, and C.Y. Chang, ¡§Analysis of Low Frequency Noise in Co-Salicided Poly-Si and Poly-SiGe Resistors¡¨ in 2002 Asia-Pasific Microwave Conference, Kyoto, Japan, p.579-581, November, 2002.
44. K.M. Chen, G.W. Huang, J.F. Kuan, T.H. Yang, H.J. Huang and C.Y. Chang, ¡§Low Frequency Noise in Boron Doped Poly-SiGe Resistors¡¨, in 2002 IEEE International Microwave Symposium, Seattle, U.S.A., p.405-408, June, 2002.
45. H. T. Lue, T. Y. Tseng, and G. W. Huang, ¡§A Novel Method to Characterize the Dielectric and Interfacial Properties of Ba0.5Sr0.5TiO3(BST)/Si by Microwave Measurement¡¨, in 2002 IEEE International Conference on Microelectronic Test Structures, Cork, Ireland, p.101-106, April, 2002.
46. K.M. Chen, H.J. Huang, G.W. Huang, T.S. Chao, Y.H. Pai, and C.Y. Chang, ¡§High-Frequency Characteristics of PMOS Transistors with Raised SiGe Source/Drain,¡¨ in 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Michigan, U.S.A., p.92-95, September, 2001.
47. K.M. Chen, H.J. Huang, L.P. Chen, G.W. Huang, and C.Y. Chang, ¡§The deposition of polycrystalline Si and SiGe by ultra-high vacuum chemical vapor deposition system,¡¨ in American Vacuum Society 46th International Symposium, Seattle, U.S.A., October, 1999.
48. L.P. Chen, B.M. Tseng, G.W. Huang, D.C. Lin, Y.P. Ho, H.Y. Lee, J.F. Kuan, Y.S. Chen, W.Y. Wen, T.L. Chen, P. Liou, H.F. Hsu, C.T. Hou, K.A. Wen and C.Y. Chang, ¡§A Novel Method for Extracting Parasitic Parameters of Silicon Spiral Inductor¡¨, in 1998 Asia-Pacific Microwave Conference, pp.581-584, Japan, December, 1998.
49. L.P. Chen, Y.P. Ho, D.C. Lin, B.M. Tseng, H.Y. Lee, R.F. Guan, G.W. Huang, Y.C. Chen, W.Y. Wen and C.L. Chen, ¡§Extraction of Parasitic Parameters of Dummy Devices on Different Silicon Substrates¡¨, in 1998 IEEE RFIC Symposium, pp.321-324, U.S.A., June, 1998.
• ±M®Ñ½×¤å
1. A reviser of Chapter 8, S. M. Sze, ¡§Semiconductor Devices: Physics and Technology¡¨, 2nd Edition, John Wiley & Sons, 2001.
• ±M§Q
1. Guo-Wei Huang, Kun-Ming Chen, Da-Yuan Chiu, Sheng-Yu Wen, Ming-Hsiang Cho, Sheng-Chun Wang, Yu-Ming Teng,, Chia-Sung Chiu, ¡§Device Monitor for RF and DC Measurement¡¨, US patent : 7126359; ¤¤µØ¥Á°ê±M§Q, No: I228597.