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- Yiming Li, Shao-Ming Yu, Jiunn-Ren Hwang, and Fu-Liang Yang, ¡§Discrete Dopant Fluctuations in 20nm/15nm-Gate Planar CMOS¡¨, IEEE TRANSACTIONS ON ELECTRON DEVICES, V. 55-6: 1449-1455 JUNE 2008.
- Yiming Li, Hung-Ming Chen, Shao-Ming Yu, Jiunn-Ren Hwang, and Fu-Liang Yang, ¡§Strained CMOS Devices with Shallow-Trench-Isolation Stress Buffer Layers,¡¨, IEEE TRANSACTIONS ON ELECTRON DEVICES, V. 55-4 : 1085-1089 APR 2008.
- C.-Y. Lin, C.-Y. Wu, T.-C. Lee, Fu-Liang Yang, C Hu., T.-Y. Tseng, ¡§Effect of Top Electrode Material on Resistive Switching Properties of ZrO2 Film Memory Devices¡¨, IEEE ELECTRON DEVICE LETTERS 28 (5): 366-368 MAY 2007.
- W. Lee, P. Su, H.-Y. Chen, C.-Y. Chang, K.-W. Su, Liu, S., and Fu-Liang Yang ¡§An Assessment of Single-Electron Effects in Multiple-Gate SOI MOSFETs with 1.6-nm Gate Oxide Near Room Temperature¡¨, IEEE ELECTRON DEVICE LETTERS 27 (3): 182-184 MAR 2006.
- C.-C. Cheng, C.-H. Chien, C.-W. Chen, S.-L. Hsu, M.-Y. Yang, C.-C. Huang, and Fu-Liang Yang, ¡§Impact of Post-Deposition-Annealing on the Electrical Characteristics of HfOxNy Gate Dielectric on Ge Substrate¡¨, MICROELECTRONIC ENGINEERING 80: 30-33 JUN 2005.
- K.-M. Chen, G.-W. Huang, S.-C. Wang, W.-K. Yeh, Y.-K. Fang, and Fu-Liang Yang, ¡§Characterization and Modeling of SOI Varactors at Various Temperatures¡¨, IEEE TRANSACTIONS ON ELECTRON DEVICES 51 (3): 427-433 MAR 2004.
- W.-K. Yeh, W.-H. Wang, Y.-K. Fang, and Fu-Liang Yang, ¡§Hot-Carrier-Induced Degradation on 0.1 ƒÝm Partially Depleted Silicon-on-Insulator Complementary Metal-Oxide-Semiconductor Field-Effect-Transistor¡¨. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS 42 (4B): 1993-1998 APR 2003.
- W.-K. Yeh, W.-H. Wang, Y.-K. Fang, M.-C. Chen, and Fu-Liang Yang, ¡§Hot-Carrier-Induced Degradation for Partially Depleted SOI 0.25-0.1ƒÝm CMOSFET with 2nm Thin Gate Oxide¡¨. IEEE TRANSACTIONS ON ELECTRON DEVICES 49 (12): 2157-2162 DEC 2002.
- W.-K. Yeh, W.-H. Wang, Y.-K. Fang, and Fu-Liang Yang, ¡§Temperature Dependence of Hot-Carrier-Induced Degradation in 0.1ƒÝm SOI nMOSFETs with Thin Oxide¡¨, IEEE ELECTRON DEVICE LETTERS 23 (7): 425-427 JUL 2002.
- W. K. Yeh, W. H. Wang, Y. K. Fang, and Fu-Liang Yang, ¡§New Observations on Hot-Carrier Degradation in 0.1ƒÝm Silicon-on-Insulator n-type Metal Oxide Semiconductor Field Effect Transistors¡¨. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS 41 (5A): L502-L504 MAY 1 2002.
- Fu-Liang Yang, R. E. Somekh, and A. L. Greer, ¡§UHV Magnetron Sputtering of Silver Films on Rock Salt: Quantitative x-ray Texture Analysis of Substrate-Temperature-Dependent Microstructure¡¨. THIN SOLID FILMS 322 (1-2): 46-55 JUN 8 1998.
- Fu-Liang Yang, A. L. Greer, and R. E. Somekh, ¡§Effects of Short-Range Ordering on Interdiffusion in Ag/Au Epitaxial Multilayers¡¨,THIN SOLID FILMS 275 (1-2): 258-261 APR 1 1996.
- Fu-Liang Yang, Y.-S. Chang, S.-M. Ma, C-S Li, ¡§Formation And Properties Of Copper Film On TL-(PB, BI)-SR-CA-CU-O Superconductor By Electrodeposition From Aqueous-Solution¡¨, JOURNAL OF MATERIALS SCIENCE 27 (21): 5739-5744 NOV 1 1992.
- S.-M. Ma, Y.-S. Chang, and Fu-Lian g Yang, ¡§Properties Of Copper-(Bi, Pb)-Sr-Ca-Cu-O Composites Formed By Electrodeposition From Aqueous-Solutions Onto The Superconductor¡¨, JOURNAL OF THE ELECTROCHEMICAL SOCIETY 139 (7): 1951-1955 JUL 1992.
- Y.-S. Chang, S-M Ma, and Fu-Liang Yang, ¡§Direct Electroplating Copper Film on the High-TC Superconductor YBa2Cu3O7-X In Aqueous-Solutions and Its Electric Characteristic¡¨, MATERIALS CHEMISTRY AND PHYSICS 28 (1): 121-131 MAY 1991.
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